NONDESTRUCTIVE LEAF-AREA ESTIMATION IN BANANA

被引：31
|
作者：
POTDAR, MV [1 ]
PAWAR, KR [1 ]
机构：
[1] MARATHWADA AGR UNIV,DEPT AGRON,PARBHANI 431402,MAHARASHTRA,INDIA
来源：
SCIENTIA HORTICULTURAE | 1991年 / 45卷 / 3-4期
关键词：
BANANA; LEAF AREA; LINEAR MEASUREMENTS; REGRESSION MODELS;
D O I：
10.1016/0304-4238(91)90070-F
中图分类号：
S6 [园艺];
学科分类号：
0902 ;
摘要：
A rapid, non-destructive and precise method for leaf area determination in 'Ardhapuri' and 'Basrai' cultivars of banana was developed from linear measurements. A strong correlation existed between leaf area (LA) and various combinations of leaf length (L) and width (W). LA can be predicted precisely with the regression models LA = 0.0334 + (LXWX0.8402) (r = 0.96) for 'Ardhapuri' and LA = 0.0266 + (LXWX0.7629) (r = 0.98) for 'Basrai'.
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页码：251 / 254
页数：4
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