INSTABILITY STUDY OF FAAS MIS SOLAR-CELL USING XPS

被引：0

|

作者：

BHAR, TN

GANJEH, J

JONES, R

机构：

[1] HOWARD UNIV,WASHINGTON,DC 20059

[2] USN,RES LAB,WASHINGTON,DC 20375

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1979年 / 8卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：726 / 726

页数：1

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