SOME ASPECTS OF THE DC RESISTIVITY OF ANNEALED MN-SIO FILMS

被引：0

作者：

CASTRO, EM ^{[1
]}

BEYNON, J ^{[1
]}

机构：

[1] BRUNEL UNIV, DEPT PHYS, UXBRIDGE UB8 3PH, MIDDLESEX, ENGLAND

来源：

THIN SOLID FILMS | 1980年 / 69卷 / 03期

关键词：

Compendex;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

FILMS

引用

页码：L43 / L46

页数：4

共 19 条

[1]

ABELES B, 1975, ADV PHYS, V24, P407, DOI 10.1080/00018737500101431

[2] ELECTRICAL RESISTIVITY AND STRUCTURAL-PROPERTIES OF EVAPORATED MANGANESE SILICON OXIDE CERMET FILMS [J].

BEYNON, J ;

MILWAY, NRP .

THIN SOLID FILMS, 1972, 14 (02) :387-396

[3] WHAT DO WE MEAN BY PRESSURE [J].

BEYNON, J .

VACUUM, 1970, 20 (10) :443-&

[4] SILICIDE FORMATION IN THIN CERMET FILMS [J].

BEYNON, J .

THIN SOLID FILMS, 1976, 37 (03) :L71-L72

[5] VARIATION OF RESISTIVITY WITH DEPOSITION RATE FOR PURE MN AND MN-MGF2 CERMET FILMS [J].

BEYNON, J ;

OLUMEKOR, L .

THIN SOLID FILMS, 1977, 41 (01) :29-33

[6] ANNEALING BEHAVIOR OF MANGANESE AND MN-SIO THIN-FILMS [J].

CASTRO, EM ;

BEYNON, J .

THIN SOLID FILMS, 1980, 66 (02) :L19-L20

[7]

ELLIOT RP, 1958, CONSTITUTION BINARY, P953

[8]

GLANG R, 1967, VACUUM, V17, P167, DOI 10.1016/0042-207X(67)93183-1

[9] PERCOLATION AND CONDUCTION [J].

KIRKPATRICK, S .

REVIEWS OF MODERN PHYSICS, 1973, 45 (04) :574-588

[10] THE ELECTRICAL RESISTANCE OF BINARY METALLIC MIXTURES [J].

LANDAUER, R .

JOURNAL OF APPLIED PHYSICS, 1952, 23 (07) :779-784

← 1 2 →