STUDY OF DEFECT PROPERTIES AND RADIATION-DAMAGE IN SOLIDS BY FIELD-ION AND ATOM-PROBE MICROSCOPY

被引：0

作者：

SEIDMAN, DN ^{[1
]}

机构：

[1] CORNELL UNIV,ITHACA,NY 14853

来源：

JOURNAL OF METALS | 1979年 / 31卷 / 12期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：116 / 116

页数：1

共 50 条

[31] ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF SURFACES OF MATERIALS
TSONG, TT
CHEN, CL
LIU, J
JOURNAL OF MATERIALS RESEARCH, 1989, 4 (06) : 1549 - 1559
[32] An electrochemical etching procedure for fabricating scanning tunneling microscopy and atom-probe field-ion microscopy tips
Yeong-Cheol Kim
David N. Seidman
Metals and Materials International, 2003, 9 : 399 - 404
[33] MICROANALYSIS OF WELDS USING FIELD-ION MICROSCOPE ATOM-PROBE
GADGIL, VJ
KOLSTER, BH
POLYMER-PLASTICS TECHNOLOGY AND ENGINEERING, 1994, 33 (06) : 691 - 712
[34] The development of atom probe field-ion microscopy
Miller, MK
MATERIALS CHARACTERIZATION, 2000, 44 (1-2) : 11 - 27
[35] A STUDY OF ALNICO MAGNETS BY ATOM PROBE FIELD-ION MICROSCOPY
ZHU, F
VONALVENSLEBEN, L
HAASEN, P
SCRIPTA METALLURGICA, 1984, 18 (04): : 337 - 342
[36] SIMPLIFIED METHOD FOR CALIBRATION OF AN ATOM-PROBE FIELD-ION MICROSCOPE
WAGNER, A
HALL, TM
SEIDMAN, DN
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (08) : 1032 - 1034
[37] FIELD-ION MICROSCOPY AND PULSED LASER ATOM-PROBE MASS-SPECTROSCOPY OF INSULATING GLASSES
KELLOGG, GL
JOURNAL OF APPLIED PHYSICS, 1982, 53 (09) : 6383 - 6386
[38] SYSTEMATIC PROCEDURES FOR ATOM-PROBE FIELD-ION MICROSCOPY STUDIES OF GRAIN-BOUNDARY SEGREGATION
KRAKAUER, BW
SEIDMAN, DN
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (09) : 4071 - 4079
[39] FIELD-ION MICROSCOPY AND ATOM-PROBE MASS-SPECTROSCOPY OF SULFUR ON THE (111) PLANE OF NICKEL
HREN, J
KELLOGG, GL
SURFACE SCIENCE, 1984, 147 (2-3) : 349 - 355
[40] QUANTITATIVE ATOM-PROBE AND FIELD-ION MICROSCOPE STUDIES AT ATOMIC RESOLUTION
TSONG, TT
CHEMICA SCRIPTA, 1979, 14 (1-5): : 7 - 15

← 1 2 3 4 5 →