STUDY OF DEFECT PROPERTIES AND RADIATION-DAMAGE IN SOLIDS BY FIELD-ION AND ATOM-PROBE MICROSCOPY

被引：0
作者：
SEIDMAN, DN [1 ]
机构：
[1] CORNELL UNIV,ITHACA,NY 14853
来源：
JOURNAL OF METALS | 1979年 / 31卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：116 / 116
页数：1
相关论文
共 50 条
  • [21] STUDY ON TITANIUM CARBIDE FIELD EMITTERS BY FIELD-ION MICROSCOPY, FIELD-ELECTRON EMISSION MICROSCOPY, AUGER-ELECTRON SPECTROSCOPY, AND ATOM-PROBE FIELD-ION MICROSCOPY
    FUTAMOTO, M
    YUITO, I
    KAWABE, U
    NISHIKAWA, O
    TSUNASHIMA, Y
    HARA, Y
    SURFACE SCIENCE, 1982, 120 (01) : 90 - 102
  • [22] A GONIOMETER HEAD FOR AN ATOM-PROBE FIELD-ION MICROSCOPE
    SARRAU, JM
    GALLOT, J
    AVENEL, O
    ROUBEAU, P
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (07): : 800 - 802
  • [23] ATOM-PROBE FIELD-ION MICROSCOPY OF A HIGH-INTENSITY GALLIUM ION-SOURCE
    CULBERTSON, RJ
    ROBERTSON, GH
    KUK, Y
    SAKURAI, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (01): : 203 - 206
  • [24] STUDIES OF SOLID-SURFACES AT ATOMIC RESOLUTION - ATOM-PROBE AND FIELD-ION MICROSCOPY
    TSONG, TT
    SURFACE SCIENCE REPORTS, 1988, 8 (3-4) : 127 - 209
  • [25] QUANTITATIVE SURFACE-ANALYSIS AT ATOMIC RESOLUTION, ATOM-PROBE FIELD-ION MICROSCOPY
    TSONG, TT
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3397 - 3404
  • [26] A CONTROLLED SPECIMEN PREPARATION TECHNIQUE FOR INTERFACE STUDIES WITH ATOM-PROBE FIELD-ION MICROSCOPY
    HENJERED, A
    NORDEN, H
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (07): : 617 - 619
  • [27] MAGNETIC-SECTOR ATOM-PROBE FIELD-ION MICROSCOPY WITH A RETARDING POTENTIAL ANALYZER
    CULBERTSON, RJ
    SAKURAI, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (05): : 1752 - 1755
  • [28] An electrochemical etching procedure for fabricating scanning tunneling microscopy and atom-probe field-ion microscopy tips
    Kim, YC
    Seidman, DN
    METALS AND MATERIALS INTERNATIONAL, 2003, 9 (04) : 399 - 404
  • [29] Atom probe field-ion microscopy applications
    Camus, Patrick P.
    High temperature science, 1988, 26 (pt 1): : 131 - 142
  • [30] ATOM PROBE FIELD-ION MICROSCOPY APPLICATIONS
    CAMUS, PP
    HIGH TEMPERATURE SCIENCE, 1989, 26 : 131 - 142
12345