DEGRADED INGAASP/INP DOUBLE HETEROSTRUCTURE LASER OBSERVATION WITH ELECTRON-PROBE MICROANALYZER

被引：14
作者：
SEKI, M
FUKUDA, M
WAKITA, K
机构：
来源：
APPLIED PHYSICS LETTERS | 1982年 / 40卷 / 02期
关键词：
D O I：
10.1063/1.93027
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：115 / 117
页数：3
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