CONTRAST FROM STACKING FAULTS IN FIELD-ION MICROGRAPHS OF HCP METALS

被引：2

作者：

RANGANAT.S

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(70)90195-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：429 / &

共 50 条

[1] ANALYSIS OF FIELD-ION MICROGRAPHS - STACKING FAULTS IN TUNGSTEN
SMITH, DA
BOWKETT, KM
PHILOSOPHICAL MAGAZINE, 1968, 18 (156): : 1219 - &
[2] DISTINCTION OF INTRINSIC FROM EXTRINSIC STACKING FAULTS IN FIELD-ION MICROGRAPHS
SMITH, DA
PHILOSOPHICAL MAGAZINE, 1969, 19 (161): : 1083 - &
[3] FIELD-ION MICROSCOPIC CONTRAST FROM PARTIAL DISLOCATIONS AND STACKING FAULTS IN BCC METALS
SMITH, DA
PHYSICA STATUS SOLIDI, 1969, 31 (01): : 347 - &
[4] CONTRAST FROM STACKING FAULTS AND PARTIAL DISLOCATIONS IN FIELD-ION MICROSCOPE
SMITH, DA
FORTES, MA
KELLY, A
RALPH, B
PHILOSOPHICAL MAGAZINE, 1968, 17 (149): : 1065 - &
[5] STREAK CONTRAST IN FIELD-ION MICROGRAPHS
BRANDON, DG
PHILOSOPHICAL MAGAZINE, 1966, 13 (125): : 1085 - &
[6] STREAK CONTRAST IN FIELD-ION MICROGRAPHS
RALPH, B
BOWKETT, KM
PHILOSOPHICAL MAGAZINE, 1966, 13 (126): : 1283 - &
[7] COMPUTER AID IN INDEXING HCP FIELD-ION MICROGRAPHS
SPROUL, WD
RICHMAN, MH
TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME, 1968, 242 (06): : 1186 - &
[8] CONTRAST FROM TWIN BOUNDARIES IN FIELD-ION MICROGRAPHS
CHANDRASEKHARAIAH, MN
RANGANATHAN, S
JOURNAL OF APPLIED PHYSICS, 1969, 40 (12) : 4835 - +
[9] INTERPRETATION OF FIELD-ION MICROGRAPHS - STREAK CONTRAST
RANGANATHAN, S
BOWKETT, KM
HREN, J
RALPH, B
PHILOSOPHICAL MAGAZINE, 1965, 12 (118) : 841 - +
[10] DISLOCATIONS AND STACKING FAULTS BY FIELD-ION MICROSCOPY
GALLOT, J
SMITH, DA
REVUE DE PHYSIQUE APPLIQUEE, 1971, 6 (01): : 11 - &