EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATION OF NB3GE FILMS

被引：11
作者：
CLAESON, T
BOYCE, JB
GEBALLE, TH
机构：
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
[2] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
来源：
PHYSICAL REVIEW B | 1982年 / 25卷 / 11期
关键词：
D O I：
10.1103/PhysRevB.25.6666
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：6666 / 6672
页数：7
相关论文
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