SPECIAL X-RAY APPARATUS FOR THE INVESTIGATION OF MATERIALS AT HIGH-TEMPERATURES

被引：0

作者：

PETKOV, VV

机构：

来源：

INDUSTRIAL LABORATORY | 1986年 / 52卷 / 12期

关键词：

CRYSTALS - X-Ray Analysis - DIFFRACTOMETERS - Reviews - RADIOGRAPHY - X-Ray - X-RAYS - Diffraction;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The review provides a critical analysis of the achievements in the last 10-15 years in the field of instrument construction for x-ray diffractometric investigations of materials at high temperatures.

引用

页码：1089 / 1103

页数：15