APPLICATION OF DARK-FIELD ELECTRON-MICROSCOPY TO CARBON STUDY

被引：126

作者：

OBERLIN, A

机构：

[1] Laboratoire Marcel Mathieu, ER 131 du C.N.R.S., UER Sciences

来源：

CARBON | 1979年 / 17卷 / 01期

关键词：

D O I：

10.1016/0008-6223(79)90065-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

New dark-field electron microscope techniques are described which allow either a radial or a complete exploration of the reciprocal space. They can be used for carbon characterization and for study of microstructure. Some applications are reviewed, particularly in the field of imaging of aromatic molecules (coals, kerogens and chars) and also for studies of graphitizing carbons (pitch-cokes, anthracene-cokes, thin carbon films) and fibers (pan-base or pitch-base). © 1979.

引用

页码：7 / 20

页数：14

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