PREDICTING RELIABILITY OF HIGH-VOLTAGE CIRCUIT BREAKERS BY A MATHEMATICAL MODEL OF FAILURES

被引：0
|
作者：
GUK, YB
机构：
来源：
ELECTRICAL TECHNOLOGY | 1969年 / 4卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：127 / &
相关论文
共 50 条
  • [1] RELIABILITY OF HIGH-VOLTAGE CIRCUIT-BREAKERS
    KOPPL, G
    ERNI, H
    BROWN BOVERI REVIEW, 1973, 60 (04): : 128 - 133
  • [2] RELIABILITY OF HIGH-VOLTAGE CIRCUIT-BREAKERS
    HOFFMANN, D
    ELEKTROTECHNISCHE ZEITSCHRIFT-ETZ, 1979, 100 (16-1): : 896 - 900
  • [3] ANALYSIS OF MATHEMATICAL-MODELS USED IN CALCULATING RELIABILITY OF HIGH-VOLTAGE CIRCUIT-BREAKERS
    OBOSKALOV, VP
    ELECTRICAL TECHNOLOGY, 1979, (02): : 84 - 95
  • [4] A SIMPLE MATHEMATICAL-MODEL FOR THE SWITCHING HYDRAULICS OF HIGH-VOLTAGE CIRCUIT-BREAKERS
    ROLFF, KP
    SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1987, 16 (02): : 66 - 71
  • [5] HIGH-VOLTAGE VACUUM CIRCUIT BREAKERS
    SHORES, RB
    PHILLIPS, VE
    IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1975, 94 (05): : 1821 - 1830
  • [6] Digital testing of high-voltage circuit breakers
    Schavemaker, PH
    van der Sluis, L
    Smeets, RPP
    Kertész, V
    IEEE COMPUTER APPLICATIONS IN POWER, 2000, 13 (02): : 52 - 56
  • [7] Accelerated diagnostics of high-voltage circuit breakers
    Mikheev G.M.
    Fedorov Yu.A.
    Shevtsov V.M.
    Batalygin S.N.
    Russian Electrical Engineering, 2007, 78 (12) : 649 - 657
  • [8] VACUUM INTERRUPTERS FOR HIGH-VOLTAGE TRANSMISSION CIRCUIT BREAKERS
    KURTZ, DR
    SOFIANEK, JC
    CROUCH, DW
    IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1975, 94 (04): : 1094 - 1094
  • [9] Adopting Circuit Breakers for High-Voltage dc Networks
    Jovcic, Dragan
    Tang, Guangfu
    Pang, Hui
    IEEE POWER & ENERGY MAGAZINE, 2019, 17 (03): : 82 - 93
  • [10] Development of high-voltage vacuum circuit breakers in China
    Liu, Zhiyuan
    Wang, Jimei
    Xiu, Shixin
    Wang, Zhongyi
    Yuan, Shun
    Jin, Li
    Zhou, Heming
    Yang, Ren
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2007, 35 (04) : 856 - 865
12345