FAULT-DIAGNOSIS WITH IMPERFECT TESTS

被引:3
作者
SHESKIN, TJ
机构
关键词
D O I
10.1109/TR.1981.5221012
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:156 / 160
页数:5
相关论文
共 21 条
[1]   ADVANCED FAULT ISOLATION SYSTEM FOR DIGITAL LOGIC [J].
BENOWITZ, N ;
CALHOUN, DF ;
ALDERSON, GE ;
BAUER, JE ;
JOECKEL, CT .
IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (05) :489-497
[2]   SOME RELIABILITY FAULT-TESTING MODELS [J].
BUTTERWORTH, R .
OPERATIONS RESEARCH, 1972, 20 (02) :335-+
[3]  
CHANG HY, 1968, SPR AFIPS P JOINT CO, V32, P529
[4]  
CHANG HY, 1970, FAULT DIAGNOSIS DIGI
[5]   DESIGN OF ADAPTIVE PROCEDURES FOR FAULT DETECTION AND ISOLATION [J].
COHN, M ;
OTT, G .
IEEE TRANSACTIONS ON RELIABILITY, 1971, R 20 (01) :7-&
[6]   OPTIMUM SEARCH ROUTINES FOR AUTOMATIC FAULT LOCATION [J].
FIRSTMAN, SI ;
GLUSS, B .
OPERATIONS RESEARCH, 1960, 8 (04) :512-523
[7]  
GLUSS B, 1959, OPS RES, V7, P467
[8]  
GOLDMAN AS, 1967, MAINTAINABILITY
[9]  
JOHNSON RA, 1959, AD213876
[10]   PARTITIONING OF MODULAR EQUIPMENT FOR FAULT ISOLATION [J].
SHESKIN, TJ .
MICROELECTRONICS AND RELIABILITY, 1978, 17 (06) :597-600