SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION

被引：55
作者：
FLOCCHINI, RG
FEENEY, PJ
SOMMERVILLE, RJ
CAHILL, TA
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1972年 / 100卷 / 03期
关键词：
D O I：
10.1016/0029-554X(72)90813-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：397 / +
页数：1
相关论文
共 11 条
[1]  
CAHILL TA, 1971, B AM PHYS SOC, V16, P545
[2]  
FLOCCHINI RG, PRIVATE COMMUNICATIO
[3]  
GOULDING FS, 1971, UCRL20625
[4]  
JAKLEVIC JM, 1970, UCRL20152
[5]   X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].
JOHANSSON, TB ;
AKSELSSON, R ;
JOHANSSON, SA .
NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+
[6]   PRECISE TEST OF Z2 DEPENDENCE OF X-RAY EMISSION INDUCED BY ALPHA PARTICLES AND DEUTERONS [J].
LEWIS, CW ;
NATOWITZ, JB ;
WATSON, RL .
PHYSICAL REVIEW LETTERS, 1971, 26 (09) :481-&
[7]  
MARION JB, 1968, NUCLEAR REACTION ANA, P136
[8]  
MUELLER PK, 1971, MAR AM CHEM SOC M LO
[9]  
RUDOLPH H, 1971, B AM PHYS SOC, V16, P545
[10]   X-RAY EMISSION INDUCED BY 30 TO 80 MEV ALPHA PARTICLES [J].
WATSON, RL ;
LEWIS, CW ;
NATOWITZ, JB .
NUCLEAR PHYSICS A, 1970, A154 (03) :561-&
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