MEASUREMENT OF THE REFRACTIVE-INDEX USING SOFT-X-RAY INTERFEROMETRY

被引：0
|
作者：
SVATOS, J [1 ]
POLACK, F [1 ]
JOYEUX, D [1 ]
PHALIPPOU, D [1 ]
机构：
[1] IOTA,LURE,CNRS,F-91403 ORSAY,FRANCE
来源：
ANNALES DE PHYSIQUE | 1992年 / 17卷 / 03期
关键词：
D O I：
10.1051/anphys/1992040
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We propose a method for measuring directly the refractive index in the soft X-ray region using a wavefront division interferometer, the Fresnel twin mirrors. we discuss the design problems and requirements which are imposed by the application of this method to soft X-rays. This method of measurement has the advantage of being insensitive to absorption and is not based on any theory of condensed state. A simulation of the whole experiment is done.
引用
收藏
页码：195 / 196
页数：2
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