EFFECTS OF OXYGEN ADSORPTION AND LOW ENERGY ION BOMBARDMENT ON ELECTRICAL PROPERTIES OF CADMIUM SULPHIDE THIN FILMS

被引：26

作者：

HUGHES, DM

CARTER, G

机构：

[1] School of Engineering Science, University College of North Wales, Bangor

[2] Department of Electrical Engineering and Electronics, University of Liverpool

来源：

PHYSICA STATUS SOLIDI | 1968年 / 25卷 / 01期

关键词：

D O I：

10.1002/pssb.19680250142

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The changes produced in the electrical properties of cadmium sulphide thin films following oxygen adsorption and low energy ion bombardment are reported. High purity cadmium sulphide thin films were prepared in an ultra high vacuum evaporating chamber and conductivity tests and adsorption and bombardment investigations were carried out without exposing the samples to atmospheric contamination. Changes in the electrical properties of the thin film samples which can be directly attributed to either oxygen contamination or radiation damage at the surface, were observed. Copyright © 1968 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：449 / &

共 11 条

[1]

ABROYAN IA, 1963, SOV PHYS-SOL STATE, V4, P1994

[2] REACTIONS OF OXYGEN WITH PURE TUNGSTEN AND TUNGSTEN CONTAINING CARBON [J].