LINE BROADENING AND INTENSITY NOISE DUE TO POLARIZATION SWITCHING IN EXTERNAL CAVITY DIODE-LASERS

被引：1

作者：

SYVRIDIS, D

GUEKOS, G

机构：

[1] Institute of Quantum Electronics, Swiss Federal Institute of Technology

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1993年 / 5卷 / 02期

关键词：

D O I：

10.1109/68.195987

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on the polarization switching as a new source of linewidth broadening and intensity noise in external grating diode laser setups that emit in a sequence of alternating wavelength intervals having TE, respectively TM polarization. At the borders between two consecutive intervals, the continuous random hopping of the system between the two polarizations, results in line broadening and in RIN values of -100 dB/Hz at frequencies below 100 MHz. In the middle part of each wavelength interval, linewidth of less than 300 KHz and low noise (< -145 dB/Hz) have been measured.

引用

页码：151 / 154

页数：4

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