PROTON MICROPROBE FOR X-RAY ANALYSIS OF ELEMENTS

被引：0
作者：
SUTER, M [1 ]
WOLFLI, W [1 ]
JUNG, H [1 ]
BONANI, G [1 ]
STOLLER, C [1 ]
机构：
[1] ETH,LAB KERNPHYS,ZURICH,SWITZERLAND
来源：
HELVETICA PHYSICA ACTA | 1975年 / 48卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：511 / 514
页数：4
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