PROTON MICROPROBE FOR X-RAY ANALYSIS OF ELEMENTS

被引:0
|
作者
SUTER, M [1 ]
WOLFLI, W [1 ]
JUNG, H [1 ]
BONANI, G [1 ]
STOLLER, C [1 ]
机构
[1] ETH,LAB KERNPHYS,ZURICH,SWITZERLAND
来源
HELVETICA PHYSICA ACTA | 1975年 / 48卷 / 04期
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D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
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页码:511 / 514
页数:4
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