UNIFIED PRESENTATION OF 1/F NOISE IN ELECTRONIC DEVICES - FUNDAMENTAL 1/F NOISE SOURCES

被引：248

作者：

VANDERZIEL, A ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT ELECT ENGN,MINNEAPOLIS,MN 55455

来源：

关键词：

D O I：

10.1109/5.4401

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

SEMICONDUCTOR DEVICES

引用

页码：233 / 258

页数：26

共 94 条

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[2] BIRBAS AN, 1987, 9TH INT C NOIS PHYS
[3] BIRBAS AN, 1987, IN PRESS 9TH INT C N
[4] BIRBAS AN, IN PRESS
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VANRHEENEN, A
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[6] FLICKER NOISE OF HOT HOLES IN SILICON AT 78-K
BOSMAN, G
ZIJLSTRA, RJJ
VANRHEENEN, A
[J]. PHYSICS LETTERS A, 1980, 80 (01) : 57 - 58
[7] BOSMAN G, COMMUNICATION
[8] CHEN WC, 1987, 9TH INT C NOIS PHYS
[9] LOW FREQUENCY NOISE IN MOS TRANSISTORS .I. THEORY
CHRISTEN.S
LUNDSTRO.I
SVENSSON, C
[J]. SOLID-STATE ELECTRONICS, 1968, 11 (09) : 797 - &
[10] LOW FREQUENCY NOISE IN MOS TRANSISTORS .2. EXPERIMENTS
CHRISTEN.S
LUNDSTRO.I
[J]. SOLID-STATE ELECTRONICS, 1968, 11 (09) : 813 - &