INTELLIGENT BACKTRACKING IN TEST-GENERATION FOR COMBINATIONAL-CIRCUITS

被引：0

|

作者：

ZENG, WB

WEI, DZ

机构：

来源：

PROCEEDINGS - IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN : VLSI IN COMPUTERS & PROCESSORS | 1989年

关键词：

D O I：

10.1109/ICCD.1989.63326

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：48 / 51

页数：4

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