A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT WITH THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0
|
作者：
KANAYA, K
OHO, E
MIZUKOSHI, N
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：387 / 388
页数：2
相关论文
共 50 条
  • [1] A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT WITH THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    OHO, E
    MIZUKOSHI, N
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 387 - 388
  • [2] A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT OF THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    OHO, E
    OSAKI, N
    ODA, T
    MICRON AND MICROSCOPICA ACTA, 1988, 19 (03): : 163 - 173
  • [3] A CONTAMINATION-REDUCING METHOD BY ION-BEAM BOMBARDMENT OF THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    OHO, E
    OGIHARA, A
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (05): : 261 - 261
  • [4] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY
    ADACHI, K
    HOJOU, K
    KANAYA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 54 - 54
  • [5] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY
    ADACHI, K
    HOJOU, K
    KANAYA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (03): : 214 - 214
  • [6] APPLICATION OF ION-BEAM SPUTTERING FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    BABA, N
    MURANAKA, Y
    ADACHI, K
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 4 (01): : 1 - 19
  • [7] APPLICATION OF ION-BEAM SPUTTERING FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    BABA, N
    HAYANO, F
    ADACHI, K
    JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (03): : 233 - 233
  • [8] SOME APPLICATIONS OF ION-BEAM SPUTTERING TO HIGH-RESOLUTION ELECTRON-MICROSCOPY
    HOJOU, K
    OIKAWA, T
    KANAYA, K
    KIMURA, T
    ADACHI, K
    MICRON, 1977, 8 (03) : 151 - 170
  • [9] QUANTITATIVE-ANALYSIS OF SPUTTERING DUE TO ION-BEAM BOMBARDMENT OF SOLIDS AND BIOLOGICAL SPECIMENS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KANAYA, K
    MURANAKA, Y
    YONEHARA, K
    ADACHI, K
    MICRON AND MICROSCOPICA ACTA, 1992, 23 (1-2): : 45 - 64
  • [10] ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPY
    KANAYA, K
    HOJOU, K
    ADACHI, K
    TOKI, K
    JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 283 - 283
12345