THEORY FOR LIGHT-EMISSION FROM A SCANNING TUNNELING MICROSCOPE

被引:275
|
作者
JOHANSSON, P [1 ]
MONREAL, R [1 ]
APELL, P [1 ]
机构
[1] UNIV AUTONOMA MADRID, DEPT FIS MAT CONDENSADA, E-28049 MADRID, SPAIN
关键词
D O I
10.1103/PhysRevB.42.9210
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have calculated the rate of light emission from a scanning tunneling microscope with an Ir tip probing a silver film. We find a considerable enhancement of the rate of spontaneous light emission compared with, for example, inverse-photoemission experiments. This enhancement is the result of an amplification of the electromagnetic field in the area below the microscope tip due to a localized interface plasmon. One can estimate that one out of 104 tunneling electrons will emit a photon. We also find that the experimentally observed maximum in the light emission as a function of bias voltage is directly related to the detailed behavior of tip-sample separation versus bias voltage. © 1990 The American Physical Society.
引用
收藏
页码:9210 / 9213
页数:4
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