INTEGRATED TEST CONCEPT FOR SWITCHED-CAPACITOR DYNAMIC MOS RAMS

被引：12
作者：
LO, TC [1 ]
GUIDRY, MR [1 ]
机构：
[1] FAIRCHILD CAMERA & INSTRUMENT,MOS DIV,MT VIEW,CA 94040
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1977年 / 12卷 / 06期
关键词：
D O I：
10.1109/JSSC.1977.1050980
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：693 / 703
页数：11
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