SILICON JUNCTION FIELD-EFFECT TRANSISTORS AT 4.2K

被引:6
作者
NAWROCKI, W
机构
[1] Technical Univ of Poznan, Poland
关键词
Cryogenics - Superconducting Devices;
D O I
10.1016/0011-2275(88)90038-0
中图分类号
O414.1 [热力学];
学科分类号
摘要
The results of investigations of Polish silicon junction field effect transistors (JFETs) of the BF 245 type at liquid helium temperature are reported. The BF 245B and the BF 245C worked satisfactorily at 4.2 K but the BF 245A transistors were weakly or not controllable in liquid helium. The following changes were observed for BF 245B and 245C transistors: the transconductance is about twice as large at 4.2 K as at 300 K, the absolute value of the pinch-off voltage is about twice as small at 4.2 K and the noise voltage is ten times smaller in liquid helium.
引用
收藏
页码:394 / 397
页数:4
相关论文
共 7 条
[1]   TIN, A CANDIDATE FOR LOW-TEMPERATURE NMR THERMOMETER [J].
AHOLA, H ;
EHNHOLM, GJ ;
ISLANDER, ST ;
OSTMAN, P ;
RANTALA, B .
CRYOGENICS, 1980, 20 (05) :277-282
[2]   MOSFET BEHAVIOR AND CIRCUIT CONSIDERATIONS FOR ANALOG APPLICATIONS AT 77-K [J].
FOX, RM ;
JAEGER, RC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (01) :114-123
[3]   SEMICONDUCTOR-DEVICES SUITABLE FOR USE IN CRYOGENIC ENVIRONMENTS [J].
LENGELER, B .
CRYOGENICS, 1974, 14 (08) :439-447
[4]  
POZHAROV AM, 1983, IZDAT RADIO SWJAZ, P30
[5]   CRYOGENIC GAAS-FET AMPLIFIERS AND THEIR USE IN NMR DETECTION [J].
RICHARDS, MG ;
ANDREWS, AR ;
LUSHER, CP ;
SCHRATTER, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03) :404-409
[6]  
VANDERZIEL A, 1962, P IRE, V50, P1808
[7]   JUNCTION FIELD EFFECT TRANSISTORS AT 4.2K [J].
WAGNER, RR ;
ANDERSON, PT ;
BERTMAN, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (07) :917-&