MEASUREMENT OF MOSFET CONSTANTS

被引：50
作者：
DELAMONEDA, FH
KOTECHA, HN
SHATZKES, M
机构：
[1] IBM CORP,FED SYST DIV,MANASSAS,VA 22110
[2] IBM CORP,GEN TECHNOL DIV,HOPEWELL JUNCTION,NY 12533
来源：
ELECTRON DEVICE LETTERS | 1982年 / 3卷 / 01期
关键词：
D O I：
10.1109/EDL.1982.25456
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：10 / 12
页数：3
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