A THEORETICAL METHOD FOR RESOLVING OVERLAPPING PEAKS IN DIFFERENTIAL SCANNING CALORIMETRY

In this work the sum of two Gaussian functions is fitted to exothermal peaks obtained through differential scanning calorimetry of amorphous semiconducting alloys. The aforementioned approximation is used to resolve overlapping peaks by a numerical method. In this procedure the experimental values are approximated by an adequate theoretical function, obtaining parameters by least-squares adjustment from certain initial values. Once the overlapping peaks are resolved, the crystallization kinetics of the semiconducting glassy alloY Cu0.10As0.45Te0.45 was studied, using the maximal-values method for calculating the kinetic parameters (activation energy, E, reaction order, n, and frequency factor, K0) of the different stages of the process.