COMPUTER-AIDED RECONSTRUCTION IMAGE FROM A DIFFRACTION PATTERN SELECTED FROM A PROCESSED ATOMIC AREA DIFFRACTOGRAM IN ELECTRON-MICROSCOPY

被引：0
|
作者：
SHINO, M
BABA, N
HOJOU, K
OIKAWA, T
KANAYA, K
机构：
[1] KOGAKUIN UNIV,SHINJUKU KU,TOKYO 160,JAPAN
[2] JEOL LTD,AKISHIMA,TOKYO 197,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1981年 / 30卷 / 03期
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D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：229 / 229
页数：1
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