STM MEASUREMENTS ON GRAPHITE USING CORRELATION AVERAGING OF THE DATA

被引：17

作者：

SOETHOUT, LL ^{[1
]}

GERRITSEN, JW ^{[1
]}

GROENEVELD, PPMC ^{[1
]}

NELISSEN, BJ ^{[1
]}

VANKEMPEN, H ^{[1
]}

机构：

[1] CATHOLIC UNIV NIJMEGEN,MAT RES INST,6525 ED NIJMEGEN,NETHERLANDS

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01386.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：251 / 258

页数：8

共 18 条

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