DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY

被引：29
作者：
COCKAYNE, DJH
HONS, A
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来源：
JOURNAL DE PHYSIQUE | 1979年 / 40卷
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D O I：
10.1051/jphyscol:1979603
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页码：11 / 18
页数：8
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