SHORT-WAVELENGTH (638NM) ROOM-TEMPERATURE CW OPERATION OF INGAAIP LASER-DIODES WITH QUATERNARY ACTIVE LAYER

被引:33
作者
ISHIKAWA, M
SHIOZAWA, H
TSUBURAI, Y
UEMATSU, Y
机构
[1] Research and Development Center, Toshiba Corporation, Kawasaki 210, 1, Komukai Toshiba-cho, Saiwai-ku
关键词
Laser and laser application; Semiconductor lasers; Vapour deposition;
D O I
10.1049/el:19900142
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
638 nm room temperature (25°C) CW operation was successfully achieved by InGaAlP visible light laser diodes with a quaternary active layer. A transverse mode stabilised selectively buried ridge-waveguide structure was fabricated by metalorganic chemical vapour deposition. The threshold current was 100 mA at 25°C and CW operation was attained at up to 50°C. The oscillation wavelength was the shortest for room temperature CW operations of laser diodes ever reported. © 1990, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码:211 / 213
页数:3
相关论文
共 7 条
[1]   SHORT-WAVELENGTH (LESS-THAN-OR-APPROXIMATELY-6400-A) ROOM-TEMPERATURE CONTINUOUS OPERATION OF P-N IN0.5(ALXGA1-X)0.5P QUANTUM WELL LASERS [J].
DALLESASSE, JM ;
NAM, DW ;
DEPPE, DG ;
HOLONYAK, N ;
FLETCHER, RM ;
KUO, CP ;
OSENTOWSKI, TD ;
CRAFORD, MG .
APPLIED PHYSICS LETTERS, 1988, 53 (19) :1826-1828
[2]  
Ishikawa M., 1986, Transactions of the Institute of Electronics and Communication Engineers of Japan, Section E (English), VE69, P382
[3]  
ISHIKAWA M, 1987, 19TH C SOL STAT DEV, P115
[4]  
Ishikawa M, 1986, 18TH INT C SOL STAT, P153
[5]   ROOM-TEMPERATURE CONTINUOUS-WAVE OPERATION OF A 640NM ALGAINP VISIBLE-LIGHT SEMICONDUCTOR-LASER [J].
KAWATA, S ;
FUJII, H ;
KOBAYASHI, K ;
GOMYO, A ;
HINO, I ;
SUZUKI, T .
ELECTRONICS LETTERS, 1987, 23 (24) :1327-1328
[6]   HIGHLY RELIABLE INGAP INGAALP VISIBLE-LIGHT EMITTING INNER STRIPE LASERS WITH 667 NM LASING WAVELENGTH [J].
OKUDA, H ;
ISHIKAWA, M ;
SHIOZAWA, H ;
WATANABE, Y ;
ITAYA, K ;
NITTA, K ;
HATAKOSHI, GI ;
KOKUBUN, Y ;
UEMATSU, Y .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1989, 25 (06) :1477-1482
[7]   INTERFACE PROPERTIES FOR GAAS/INGAALP HETEROJUNCTIONS BY THE CAPACITANCE-VOLTAGE PROFILING TECHNIQUE [J].
WATANABE, MO ;
OHBA, Y .
APPLIED PHYSICS LETTERS, 1987, 50 (14) :906-908