ELLIPSO-REFLECTOMETRY AT NICKEL IN SULFURIC-ACID-SOLUTIONS

被引：16
作者：
HEUSLER, KE
OHTSUKA, T
机构：
来源：
SURFACE SCIENCE | 1980年 / 101卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(80)90612-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：194 / 204
页数：11
相关论文
共 24 条
[1]  
BARRETT MA, 1970, S FARADAY SOC, V4, P72
[2]   MODULATION ELLIPSOMETRY AND ITS APPLICATION TO STUDY OF ELECTRODE-ELECTROLYTE INTERFACE [J].
CAHAN, BD ;
HORKANS, J ;
YEAGER, E .
SURFACE SCIENCE, 1973, 37 (01) :559-567
[3]   SPECULAR REFLECTANCE AND ELLIPSOMETRIC SPECTROSCOPY OF ORIENTED MOLECULAR LAYERS [J].
DIGNAM, MJ ;
MOSKOVITS, M ;
STOBIE, RW .
TRANSACTIONS OF THE FARADAY SOCIETY, 1971, 67 (587) :3306-+
[4]  
DRUDE P, 1920, THEORY OPTICS
[5]  
GORN F, 1969, THESIS FREIE U BERLI
[6]   ELECTROCHEMICAL AND OPTICAL STUDIES OF THICK OXIDE LAYERS ON IRIDIUM AND THEIR ELECTROCATALYTIC ACTIVITIES FOR OXYGEN EVOLUTION REACTION [J].
GOTTESFELD, S ;
SRINIVASAN, S .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1978, 86 (01) :89-104
[7]  
HEUSLER KE, 1978, PASSIVITY METALS, P771
[8]  
HEUSLER KE, ELECTROCHEMISTRY ELE
[9]   ELECTRODE POTENTIAL SCANNING ELLIPSOMETRIC SPECTROSCOPY - STUDY OF FORMATION OF ANODIC OXIDE FILM ON NOBLE-METALS [J].
HORKANS, J ;
CAHAN, BD ;
YEAGER, E .
SURFACE SCIENCE, 1974, 46 (01) :1-23
[10]   MULTIPLE-ANGLE-OF-INCIDENCE ELLIPSOMETRY OF VERY THIN FILMS [J].
JOHNSON, JA ;
BASHARA, NM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (04) :457-&
123