CHARGED-PARTICLE ACTIVATION METHODS FOR THE ANALYSIS OF CARBON AND OXYGEN IN HIGH-PURITY GALLIUM

被引：5

作者：

BAKRAJI, EH

GIOVAGNOLI, A

BLONDIAUX, G

DEBRUN, JL

机构：

[1] CNRS-CERI, 3A, rue de la Férollerie

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 50卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90332-O

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Methods for the instrumental analysis of C and O at trace level in high-purity gallium were developed. The 12C (d, n)13N and 16O(t, n)18F reactions were used between 2.5 and 3.5 MeV, allowing analyses down to tens of ppb/weight. The 16O(p, α)13N reaction at 15 MeV was also used; in this case 13N has to be separated radiochemically. © 1990.

引用

页码：65 / 67

页数：3

共 5 条

[1] THE PROBLEM OF DIFFUSION DURING CHARGED-PARTICLE ACTIVATION-ANALYSIS - THE CASE OF F-18 IN PURE GERMANIUM SINGLE-CRYSTALS [J].