RUTHERFORD BACKSCATTERING SPECTROMETRY OF REAL CDTE SURFACES

被引：3

作者：

PERILLO, E

SPADACCINI, G

VIGILANTE, M

SAVASTANO, M

MANCINI, AM

QUIRINI, A

VASANELLI, L

GIORGI, R

机构：

[1] IST NAZL FIS NUCL,NAPOLI,ITALY

[2] UNIV BARI,DEPARTIMENTO FIS,I-70124 BARI,ITALY

[3] IST NAZL FIS NUCL,BARI,ITALY

[4] UNIV LECCE,DEPARTIMENTO FIS,I-73100 LECCE,ITALY

[5] ENERGIA NUCL & ENERGIA ALTERNAT,CTR RIC CASACCIA,DIPARTIMENTO TIB,ROMA,ITALY

来源：

VACUUM | 1989年 / 39卷 / 2-4期

关键词：

D O I：

10.1016/0042-207X(89)90177-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：125 / 127

页数：3

共 6 条

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[2] STUDIES OF CDTE SURFACES WITH SECONDARY ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING AND ELLIPSOMETRY [J].

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[3] STUDY OF CLEAVED, OXIDIZED, ETCHED, AND HEAT-TREATED CDTE SURFACES [J].

HARING, JP ;

WERTHEN, JG ;

BUBE, RH ;

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JANSEN, W ;

LUSCHER, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1469-1472

[4] A REVIEW OF OHMIC AND RECTIFYING CONTACTS ON CADMIUM TELLURIDE [J].

PONPON, JP .

SOLID-STATE ELECTRONICS, 1985, 28 (07) :689-706

[5]

PONPON JP, 1972, APPL PHYS A, V27, P11

[6]

SAVASTANO M, 1987, THESIS U NAPLES

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