X-RAY DIFFRACTION AND ELECTRON-MICROSCOPIC STUDY OF THIN LAYERSOF YTTERBIUM

被引：14
作者：
BOULESTEIX, C
VALIERGUE, L
GASGNIER, M
LABLANCH.CH
机构：
来源：
THIN SOLID FILMS | 1970年 / 5卷 / 01期
关键词：
D O I：
10.1016/0040-6090(70)90047-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：15 / +
页数：1
相关论文
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