NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION

被引：96

作者：

FISCHER, UC ^{[1
]}

DURIG, UT ^{[1
]}

POHL, DW ^{[1
]}

机构：

[1] IBM RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 04期

关键词：

D O I：

10.1063/1.99483

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：249 / 251

页数：3

共 13 条

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[8]

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[9] SUPERRESOLUTION FLUORESCENCE NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

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