ON PRODUCING HIGH-SPATIAL-RESOLUTION COMPOSITION PROFILES VIA SCANNING-TRANSMISSION ELECTRON-MICROSCOPY

被引：42

作者：

HALL, EL ^{[1
]}

IMESON, D ^{[1
]}

VANDERSANDE, JB ^{[1
]}

机构：

[1] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1981年 / 43卷 / 06期

关键词：

D O I：

10.1080/01418618108239528

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1569 / 1585

页数：17

共 19 条

[1] ABSORPTION EFFECTS IN STEM MICROANALYSIS OF CERAMIC OXIDES [J].

BENDER, BA ;

WILLIAMS, DB ;

NOTIS, MR .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1980, 63 (3-4) :149-151

[2] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].

CLIFF, G ;

LORIMER, GW .

JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207

[3]

DOIG P, 1978, J MICROSC-OXFORD, V112, P257, DOI 10.1111/j.1365-2818.1978.tb00076.x

[4]

DOIG P, 1980, PHILOS MAG A, V41, P761, DOI 10.1080/01418618008239347

[5] IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

FAULKNER, RG ;

HOPKINS, TC ;

NORRGARD, K .

X-RAY SPECTROMETRY, 1977, 6 (02) :73-79

[6] X-RAY MICROANALYTICAL SENSITIVITY AND SPATIAL-RESOLUTION IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPES [J].

FAULKNER, RG ;

NORRGARD, K .

X-RAY SPECTROMETRY, 1978, 7 (04) :184-189

[7]

FAULKNER RG, 1978, 9TH P INT C EL MICR, V1, P546

[8]

GEISS RH, 1979, ULTRAMICROSCOPY, V3, P397

[9]

Goldstein J. I., 1977, Proceedings of the 10th Annual Scanning Electron Microscopy Symposium, P315

[10]

GOLDSTEIN JI, 1978, P SPECIALIST WORKSHO, P166

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