A MIRROR ELECTRON-MICROSCOPE FOR SURFACE-ANALYSIS

被引:15
作者
FOSTER, MS [1 ]
CAMPUZANO, JC [1 ]
WILLIS, RF [1 ]
DUPUY, JC [1 ]
机构
[1] INST NATL SCI APPL LYON,F-69621 VILLEURBANNE,FRANCE
来源
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷
关键词
D O I
10.1111/j.1365-2818.1985.tb02692.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:395 / 403
页数:9
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