INVESTIGATION OF IMPERFECTIONS IN SILICON SUBSTRATES USING COPPER DISPLACEMENT TECHNIQUE AND X-RAY TOPOGRAPHY

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作者：
GRIECO, MJ
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1971年 / 118卷 / 08期
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O646 [电化学、电解、磁化学];
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081704 ;
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页码：C223 / &
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