JMASM 51: Bayesian Reliability Analysis of Binomial Model - Application to Success/Failure Data

被引：2

作者：

Akhtar, M. Tanwir ^{[1
]}

Khan, Athar Ali ^{[2
]}

机构：

[1] Saudi Elect Univ, Jeddah, Saudi Arabia

[2] Aligarh Muslim Univ, Aligarh, Uttar Pradesh, India

来源：

JOURNAL OF MODERN APPLIED STATISTICAL METHODS | 2018年 / 17卷 / 02期

关键词：

Bayesian Analysis; binomial model; Laplace approximation; simulation; posterior; R;

D O I：

10.22237/jmasm/1553803862

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

Reliability data are generated in the form of success/failure. An attempt was made to model such type of data using binomial distribution in the Bayesian paradigm. For fitting the Bayesian model both analytic and simulation techniques are used. Laplace approximation was implemented for approximating posterior densities of the model parameters. Parallel simulation tools were implemented with an extensive use of R and JAGS. R and JAGS code are developed and provided. Real data sets are used for the purpose of illustration.

引用

页数：32

共 30 条

[1] Bayesian analysis of generalized log-Burr family with R [J].