IMPROVED HIGH-TEMPERATURE X-RAY LANG CAMERA

被引:1
作者
MIZUNO, K [1 ]
ONO, K [1 ]
ITO, K [1 ]
KINO, T [1 ]
机构
[1] HIROSHIMA UNIV,FAC SCI,CRYSTAL PHYS LAB,HIROSHIMA 724,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 11期
关键词
X-RAY LANG CAMERA; SINGLE-SCANNED TOPOGRAPH; VACANCY SOURCE; INTERSTITIAL LOOP; NEARLY PERFECT CRYSTAL;
D O I
10.1143/JJAP.31.3738
中图分类号
O59 [应用物理学];
学科分类号
摘要
A high-temperature X-ray Lang camera which has very slow translational speed without multiscanning is designed to observe slowly changing phenomena using a conventional X-ray source. A single-scanned topograph of a nearly perfect aluminum crystal taken by this camera indicates an annihilation profile of interstitial-type dislocation loops grown as vacancy sources due to a temperature rise.
引用
收藏
页码:3738 / 3739
页数:2
相关论文
共 4 条
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