AN IMPROVED METHOD FOR NUMERICAL-ANALYSIS OF POINT ELECTRON AND ION-SOURCE OPTICS

被引：23
作者：
KANG, NK
ORLOFF, J
SWANSON, LW
TUGGLE, D
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 19卷 / 04期
关键词：
D O I：
10.1116/1.571172
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1077 / 1081
页数：5
相关论文
共 9 条
[1]   FIELD-EMISSION GUNS FOR ELECTRON-PROBE INSTRUMENTS [J].
CLEAVER, JRA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1975, 38 (04) :513-529
[2]   ANALYSIS OF A TEMPERATURE-FIELD ELECTRON-GUN [J].
ELKAREH, AB .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1227-1227
[3]  
HAUKE R, 1976, THESIS U TUBINGEN W
[4]  
KASPER E, 1979, OPTIK, V54, P135
[5]  
KERN D, 1978, THESIS U TUBINGEN W
[6]   THERMIONIC EMISSION, FIELD EMISSION, AND THE TRANSITION REGION [J].
MURPHY, EL ;
GOOD, RH .
PHYSICAL REVIEW, 1956, 102 (06) :1464-1473
[7]   WORK FUNCTIONS OF THE (001) FACE OF THE HEXABORIDES OF BA, LA, CE AND SM [J].
SWANSON, LW ;
MCNEELY, DR .
SURFACE SCIENCE, 1979, 83 (01) :11-28
[8]  
SWANSON LW, APPL SURF SCI
[9]   POINT-CATHODE ELECTRON SOURCES-ELECTRON OPTICS OF INITIAL DIODE REGION [J].
WIESNER, JC ;
EVERHART, TE .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (05) :2140-2148
1