EFFECT OF TIP ATOMIC AND ELECTRONIC-STRUCTURE ON SCANNING TUNNELING MICROSCOPY SPECTROSCOPY

被引：0

作者：

TSUKADA, M ^{[1
]}

KOBAYASHI, K ^{[1
]}

ISSHIKI, N ^{[1
]}

机构：

[1] KAO CORP,KAO INST KNOWLEDGE & INTELLIGENCE SCI,SUMIDA KU,TOKYO 131,JAPAN

来源：

SURFACE SCIENCE | 1991年 / 242卷 / 1-3期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The current image and the tunnel conductance in the scanning tunneling microscopy/spectroscopy (STM/STS) of graphite are simulated by the first-principles local density functional calculation of the electronic states. As models of the tip, W10[111], W14[110], W13[110] and Pt10[111] clusters are used. For the tips with a single apex atom, normal STM images are obtained. However, abnormal images are generated by the removal of the apex atom. STS spectra are changed in a systematic way by the apex angle of the tip. The negative differential resistance observed in the STS of the Si(111) square-root 3 x square-root 3-B/ defect surface is reproduced by the theoretical simulation with the cluster models of the tip.

引用

页码：12 / 17

页数：6

共 12 条

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