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ANALYSIS OF CERTAIN ERRORS IN THE X-RAY REFLECTION METHOD FOR THE QUANTITATIVE DETERMINATION OF PREFERRED ORIENTATIONS
被引:62
作者
:
CHERNOCK, WP
论文数:
0
引用数:
0
h-index:
0
CHERNOCK, WP
BECK, PA
论文数:
0
引用数:
0
h-index:
0
BECK, PA
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1952年
/ 23卷
/ 03期
关键词
:
D O I
:
10.1063/1.1702204
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:341 / 345
页数:5
相关论文
共 3 条
[1]
HU H, 1950, AM I MINING ENG J ME, P1214
[2]
A TECHNIQUE FOR QUANTITATIVE DETERMINATION OF TEXTURE OF SHEET METALS
[J].
NORTON, JT
论文数:
0
引用数:
0
h-index:
0
NORTON, JT
.
JOURNAL OF APPLIED PHYSICS,
1948,
19
(12)
:1176
-1178
[3]
A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER
[J].
SCHULZ, LG
论文数:
0
引用数:
0
h-index:
0
SCHULZ, LG
.
JOURNAL OF APPLIED PHYSICS,
1949,
20
(11)
:1030
-1032
←
1
→
共 3 条
[1]
HU H, 1950, AM I MINING ENG J ME, P1214
[2]
A TECHNIQUE FOR QUANTITATIVE DETERMINATION OF TEXTURE OF SHEET METALS
[J].
NORTON, JT
论文数:
0
引用数:
0
h-index:
0
NORTON, JT
.
JOURNAL OF APPLIED PHYSICS,
1948,
19
(12)
:1176
-1178
[3]
A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER
[J].
SCHULZ, LG
论文数:
0
引用数:
0
h-index:
0
SCHULZ, LG
.
JOURNAL OF APPLIED PHYSICS,
1949,
20
(11)
:1030
-1032
←
1
→