TEMPERATURE-DEPENDENCE OF EFFECTIVITY OF ELECTRON-CAPTURE TO AXIAL CHANNELING MODE

被引:0
|
作者
FILIMONOV, YM
TARATIN, AM
机构
来源
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:69 / 74
页数:6
相关论文
共 50 条
  • [41] TEMPERATURE-DEPENDENCE OF THE ELECTRON-MOBILITY IN GAAS
    JERVIS, TR
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 53 (02): : K199 - K202
  • [42] TEMPERATURE-DEPENDENCE OF ELECTRON EFFECTIVE MASS IN INSB
    KOTELES, ES
    DATARS, WR
    PHYSICAL REVIEW B, 1974, 9 (02): : 568 - 571
  • [43] A SIMPLE CLASSICAL-MODEL FOR THE IMPACT PARAMETER DEPENDENCE OF ELECTRON-CAPTURE
    BRANDT, D
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 214 (01): : 93 - 96
  • [44] THE TEMPERATURE OPTIMIZATION OF ELECTRON-CAPTURE DETECTION IN GAS-CHROMATOGRAPHY
    PELTONEN, K
    LC GC-MAGAZINE OF SEPARATION SCIENCE, 1990, 8 (03): : 242 - &
  • [45] NON-RADIOACTIVE ELECTRON-CAPTURE DETECTOR OPERATING IN THE PULSED MODE
    WENTWORTH, WE
    LIMERO, T
    BATTEN, CF
    CHEN, ECM
    JOURNAL OF CHROMATOGRAPHY, 1988, 441 (01): : 45 - 62
  • [46] TEMPERATURE-DEPENDENCE OF RESONANCE FREQUENCIES IN 2-AXIAL ANTIFFEROMAGNET
    POPOV, VA
    SKIDANEN.VI
    FIZIKA TVERDOGO TELA, 1973, 15 (03): : 899 - 901
  • [47] Half-life of the electron-capture decay of 97Ru: Precision measurement shows no temperature dependence
    Goodwin, J. R.
    Golovko, V. V.
    Iacob, V. E.
    Hardy, J. C.
    PHYSICAL REVIEW C, 2009, 80 (04):
  • [48] TEMPERATURE-DEPENDENCE OF ELECTRON TRAPPING IN METAL-OXIDE-SEMICONDUCTOR DEVICES AS A FUNCTION OF THE INJECTION MODE
    GILDENBLAT, GS
    HUANG, CL
    GROT, SA
    JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) : 2150 - 2152
  • [49] HIGH-TEMPERATURE DC ELECTRON-CAPTURE DETECTOR WITH SEPARATED IONIZATION AND CAPTURE REGIONS
    SIU, KWM
    AUE, WA
    MIKROCHIMICA ACTA, 1983, 1 (5-6) : 419 - 430
  • [50] OBSERVATION OF OSCILLATIONS IN CHARGE DEPENDENCE OF TOTAL ELECTRON-CAPTURE CROSS-SECTIONS
    KIM, HJ
    HVELPLUND, P
    MEYER, FW
    PHANEUF, RA
    STELSON, PH
    BOTTCHER, C
    PHYSICAL REVIEW LETTERS, 1978, 40 (25) : 1635 - 1638