DIRECT OBSERVATIONS OF COLUMNAR STRUCTURE IN GLASSY-GESE2 FILMS BY ELECTRON-MICROSCOPY

被引：14

作者：

CHEN, CH

机构：

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1981年 / 44卷 / 2-3期

关键词：

D O I：

10.1016/0022-3093(81)90043-0

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：391 / 395

页数：5

共 9 条

[1] MICROSCOPIC ORIGIN OF THE COMPANION A1 RAMAN LINE IN GLASSY GE(S,SE)2 [J].

BRIDENBAUGH, PM ;

ESPINOSA, GP ;

GRIFFITHS, JE ;

PHILLIPS, JC ;

REMEIKA, JP .

PHYSICAL REVIEW B, 1979, 20 (10) :4140-4144

[2] EXCESS ULTRASONIC-ATTENUATION IN AS2S3 GLASS AFTER ELECTRIC-FIELD REMOVAL [J].

CLAYTOR, TN ;

SLADEK, RJ .

PHYSICAL REVIEW LETTERS, 1979, 42 (22) :1482-1485

[3]

LEAMY HJ, 1979, CURRENT TOPICS MATER

[4]

OKANO S, 1978, SOL ST COMMUN, V28, P269

[5]

PHILIPS JC, UNPUBLISHED

[6]

RUHLE M, 1975, CRYST LATT DEF AMORP, V6, P129

[7] PHOTO-CONTRACTION EFFECT IN AMORPHOUS SE1-XGEX FILMS [J].

SINGH, B ;

RAJAGOPALAN, S ;

BHAT, PK ;

PANDYA, DK ;

CHOPRA, KL .

SOLID STATE COMMUNICATIONS, 1979, 29 (03) :167-169

[8] TEMPERATURE AND FREQUENCY DEPENDENCES OF FAR-INFRARED AND MICROWAVE OPTICAL-ABSORPTION IN AMORPHOUS MATERIALS [J].

STROM, U ;

TAYLOR, PC .

PHYSICAL REVIEW B, 1977, 16 (12) :5512-5522

[9] BILEVEL HIGH-RESOLUTION PHOTOLITHOGRAPHIC TECHNIQUE FOR USE WITH WAFERS WITH STEPPED AND-OR REFLECTING SURFACES [J].

TAI, KL ;

SINCLAIR, WR ;

VADIMSKY, RG ;

MORAN, JM ;

RAND, MJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :1977-1979

← 1 →