共 50 条
- [41] Using Deep Learning ADC for Defect Classification for Automatic Defect Inspection METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
- [42] Evaluation of EUV mask defect using blank inspection, patterned mask inspection, and wafer inspection EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II, 2011, 7969
- [43] Automatic non-contact defect inspection of cylindrical shell using a laser-ultrasonic technique ADVANCES IN NONDESTRUCTIVE EVALUATION, PT 1-3, 2004, 270-273 : 334 - 339
- [47] Guided UT wave inspection of insulated feedwater piping using magnetostrictive sensors NONDESTRUCTIVE EVALUATION OF UTILITIES AND PIPELINES, 1996, 2947 : 205 - 210
- [48] Inspection robot climbing vertical cross piping using magnetic adhesive mechanism JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2008, 10 (05): : 1069 - 1074
- [49] Synchronous laser scanning IR imaging for chip bonding defect inspection 2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 448 - 450
- [50] Evaluation of extreme ultraviolet mask defect using blank inspection, patterned mask inspection, and wafer inspection JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2011, 10 (04):