RELIABILITY-ANALYSIS OF A HUMAN OPERATOR UNDER SEVERAL LEVELS OF STRESS

被引：0

作者：

CHUNG, WK

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1991年 / 31卷 / 2-3期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A reliability analysis of a human operator performing his tasks under several levels of stress is presented. The system is in a failed state when the operator fails to perform a task which could result in disruption of the operations. Laplace transforms of state probabilities and operator reliability are developed. The mean time to human error is also obtained.

引用

页码：367 / 370

页数：4

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