YIELD MODEL FOR PRODUCTIVITY OPTIMIZATION OF VLSI MEMORY CHIPS WITH REDUNDANCY AND PARTIALLY GOOD PRODUCT

被引：142
作者：
STAPPER, CH
MCLAREN, AN
DRECKMANN, M
机构：
来源：
IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1980年 / 24卷 / 03期
关键词：
D O I：
10.1147/rd.243.0398
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：398 / 409
页数：12
相关论文
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