ANALYTICAL ELECTRON-MICROSCOPIC STUDIES OF DOPED DICALCIUM SILICATES

被引：27
|
作者：
CHAN, CJ [1 ]
KRIVEN, WM [1 ]
YOUNG, JF [1 ]
机构：
[1] ANACHEM CHEM LTD, MONTREAL, QUEBEC, CANADA
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1988年 / 71卷 / 09期
关键词：
D O I：
10.1111/j.1151-2916.1988.tb06403.x
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：713 / 719
页数：7
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