ANALYTICAL ELECTRON-MICROSCOPIC STUDIES OF DOPED DICALCIUM SILICATES

被引：27

作者：

CHAN, CJ ^{[1
]}

KRIVEN, WM ^{[1
]}

YOUNG, JF ^{[1
]}

机构：

[1] ANACHEM CHEM LTD, MONTREAL, QUEBEC, CANADA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1988.tb06403.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：713 / 719

页数：7

共 26 条

[1] [Anonymous], UNPUB
[2] CHAN CJ, 1987, AM CERAM SOC B, V66, P519
[3] CHAN CJ, 1986, 44TH P ANN M EL MICR, P452
[4] CHAN CJ, 1986, 1985 P BEIJ INT S CE, V1, P11
[5] CHOPRA S, 1983, 5TH P INT C CEM MICR, P11
[6] DERDACKAGRZYMEK A, 1978, POL AKAD NAUK KRAKWI, V29, P1
[7] FOREST J, 1968, 5TH P INT S CHEM CEM, V1, P32
[8] GAWLICKI M, 1985, 14TH P C SIL IND SIL, V3, P67
[9] ELECTRON-MICROPROBE ANALYSIS OF PORTLAND-CEMENT CLINKERS
GHOSE, A
BARNES, P
[J]. CEMENT AND CONCRETE RESEARCH, 1979, 9 (06) : 747 - 755
[10] MICROSTRUCTURAL CHARACTERIZATION OF DOPED DICALCIUM SILICATE POLYMORPHS
GHOSE, A
CHOPRA, S
YOUNG, JF
[J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (10) : 2905 - 2914